Maestría en Microelectrónica (UNIVERSIDADE FEDERAL DO RIO GRANDE DO SUL)
Ingeniero Electrónico DOCENTE CONTRATADO - CONTRATADO Tiempo parcial por asignaturas (TPA) Departamento Académico de Ingeniería - Sección Electricidad y Electrónica
CALIENES, W. E.(2017). Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition.. MICROELECTRONICS RELIABILITY. Volumen: 76-77. (pp. 655 - 659).
CALIENES, W. E.(2017). MRAM Control Transistor Resilience Against Heavy-Ion Impacts. En 10th IEEE International Caribbean Conference on Devices, Circuits And Systems ICCDCS 2017. IEEE.
CALIENES, W. E.(2017). Process and Temperature Impact on Single-Event Transients in 28nm FDSOI CMOS.. En 8th IEEE Latin American Symposium on Circuits and Systems LASCAS 2017. IEEE.
CALIENES, W. E.(2016). FDSOI and Bulk CMOS SRAM Cell Resilience to Radiation Effects.. MICROELECTRONICS RELIABILITY. (pp. 152 - 157).
CALIENES, W. E.(2016). Simulation of Single-Event Effects on Fully Depleted Silicon On- Insulator (FDSOI) CMOS.. En Semiconductor Devices in Harsh Conditions. (pp. 43 - 68). CRC Press.
CALIENES, W. E.(2015). Estudo e Implementação do Algoritmo Simulated Annealing para Posicionamento de Células utilizando LabVIEW. En Iberchip 2015. IBERCHIP.
CALIENES, W. E.(2015). Modeling the impact of Heavy Ion on FDSOI NanoCMOS. En IEEE 6th Latin American Symposium on Circuits & Systems. IEEE.
CALIENES, W. E.(2014). Bulk and FDSOI SRAM Resiliency to Radiation Effects. En IEEE 57th International Midwest Symposium of Circuits and Systems. IEEE.
